J.A. Woollam

🌟 Congratulations to Carlos Armenta from New Mexico State University for winning the Outstanding Oral Presentation award at the AVS 70th Symposium & Exhibition in Tampa! 🎉 Carlos’s presentation, "Modeling Many-body Effects in Ge Using Pump-probed Femtosecond Ellipsometry," highlights the effects of different carrier concentrations on materials optical properties using pump-probed Femtosecond ellipsometry. J.A. Woollam Co. is proud to invest in the futures of students, empowering the next generation of scientists to push the boundaries of technology and innovation. 👏👏 #AVS70 #Ellipsometry #JAWoollamCo #ScienceInnovation

It’s been an incredible week at the AVS International Symposium & Exhibition in Tampa! We were honored to participate in such a dynamic event filled with engaging talks, insightful poster sessions, and inspiring symposium presentations. A special congratulations to Alex Bordovalos, this year’s J.A. Woollam Co.’s scholarship recipient! His innovative work on custom neural networks for ellipsometric data interpretation is truly advancing the field. Thank you to everyone who visited our booth, connected with us in sessions, and shared your research. We’re proud to support the brilliant minds driving the future of materials science! #AVS2024 #JAWoollam #MaterialsScience #Ellipsometry #ScholarshipWinner

Register Now to Explore the Future of Thin-Film Characterization with Spectroscopic Ellipsometry! Are you a researcher or engineer looking to advance your knowledge and skills in thin film analysis for product R&D? If so, this webinar introduces an increasingly powerful and fast-growing optical technique for thin-film characterization on R&D Applications of Spectroscopic Ellipsometry. In this episode, Dr. Jianing Sun explains the operating principles and theory of Spectroscopic Ellipsometry before demonstrating its broad applications in thin film research and development across industries including semiconductors, displays, optical devices, photovoltaics, biotechnology, chemistry, and advanced materials 📊 Key topics include: -Fundamentals of spectroscopic ellipsometry -Its unique advantages and potential limitations -Real-world case studies and applications in R&D -In-situ and dynamic ellipsometry techniques 👩🔬 Meet our Speaker: Jianing Sun, PhD, Applications Engineer, J.A. Woollam Co. Dr. Jianing Sun has been with J.A. Woollam Company since 2008, with over 16 years of experience in developing ellipsometry techniques for thin-film research, particularly in semiconductors and materials science. She holds a Bachelor’s and Master’s in Chemical Engineering from Tsinghua University and a PhD in Materials Science and Engineering from the University of Michigan. Learn how ellipsometry provides vital insights for real-time process control and property monitoring. 🗓 Date: October 17th, 2024 | 11AM PT 🔗 Register here: https://lnkd.in/g-G54HDY Don’t miss out—register today and share with your network!

🚀 T-minus ONE WEEK! Don’t wait—apply today and take the next step in your educational journey by applying for the J.A. Woollam Company Scholarship through the Society of Vacuum Coaters Foundation! Deadline is Oct. 18th.

𝗜𝗳 𝘆𝗼𝘂 𝘄𝗼𝗿𝗸 𝘄𝗶𝘁𝗵 𝘁𝗵𝗶𝗻 𝗳𝗶𝗹𝗺𝘀, 𝘁𝗵𝗶𝘀 𝘁𝗲𝗰𝗵𝗻𝗶𝗾𝘂𝗲 𝘀𝗵𝗼𝘂𝗹𝗱 𝙙𝙚𝙛𝙞𝙣𝙞𝙩𝙚𝙡𝙮 𝗯𝗲 𝗼𝗻 𝘆𝗼𝘂𝗿 𝗿𝗮𝗱𝗮𝗿! 📡 Spectroscopic Ellipsometry is a non-destructive optical technique used for precise characterization of #thin-films and coatings ranging from sub-nanometer up to 10s of microns thick! In Covalent Academy's next webinar event, guest speaker Dr. Jianing Sun from J.A. Woollam will catch you up with some of the latest applications of Ellipsometry across industries including #semiconductors, #biotech, #displays, and more! Come learn the principles of this technique and find out why its popularity in R&D has been growing so rapidly in recent years. 𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿 𝗻𝗼𝘄: https://bit.ly/4gXj6SX

❗ 𝗖𝗮𝗹𝗹𝗶𝗻𝗴 𝗮𝗹𝗹 𝗿𝗲𝘀𝗲𝗮𝗿𝗰𝗵𝗲𝗿𝘀 𝗮𝗻𝗱 𝗲𝗻𝗴𝗶𝗻𝗲𝗲𝗿𝘀 𝘄𝗼𝗿𝗸𝗶𝗻𝗴 𝘄𝗶𝘁𝗵 𝘁𝗵𝗶𝗻 𝗳𝗶𝗹𝗺𝘀❗ You won't want to miss our upcoming webinar event, in partnership with J.A. Woollam. This talk delves into 𝙎𝙥𝙚𝙘𝙩𝙧𝙤𝙨𝙘𝙤𝙥𝙞𝙘 𝙀𝙡𝙡𝙞𝙥𝙨𝙤𝙢𝙚𝙩𝙧𝙮, a cutting-edge optical technique revolutionizing thin-film characterization for R&D. You'll learn how the technique works, its advantages and limitations, and get to see real examples and case studies of its industry R&D applications, including in-situ and dynamic ellipsometry techniques! Discover how Ellipsometry can unlock critical insights for real-time process control and property monitoring. Register to join us at: https://bit.ly/4ev0mbR

24th Annual J. A. Woollam Spectroscopic Ellipsometry Workshop at the The University of Manchester This annual free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. Application engineers from J.A. Woollam are giving talks on the following topics: - Theory - Applications - Products - Demonstration - .J A. Woollam alpha-SE Ellipsometer #Ellipsometry #Ellipsometers #JAWoollam #QDUKI #QuantumDesignUKandIreland #SpectroscopicEllipsometry #WoollamWorkshop

This week I had this chance to attend Ellipsometry workshop in Manchester University held by J. A. Woollam " Industry leading Ellipsometer for thin film characterization" It was great experience to learn more about equipment, meet experts in this field and get to know new techniques for modelling thin film thickness Special thanks to Dr. Shayz Ikram and Angela Carslake for organising this wonderful event.

Our J.A. Woollam Applications Engineers are visiting our partners at Linkam, global leaders in temperature control technology. Together, we’re advancing temperature-dependent characterization of thin films, measuring both thickness and refractive index using Linkam temperature stages integrated with our spectroscopic ellipsometers. #SpectroscopicEllipsometry #ScientificCollaboration #JAWoollam #Linkam #AdvancedResearch