Film Sense

Film Sense Our mission is to create compact and affordable multi-wavelength ellipsometer systems that provide optimal measurement solutions for a wide range of thin film applications. We provide our customers with honest and objective advice on how our ellipsometers can best meet their measurement requirements. The FS-1 Multi-Wavelength Ellipsometer Since ellipsometry uses polarized light, an ellipsometer system is typically a complex and expensive optical instrument. However, the FS‑1 Multi-Wavelength Ellipsometer hides the complexity from the user, packaging powerful banded wavelength ellipsometer technology into a compact, robust and affordable sensor, and enabling quick and accurate ellipsometric measurements. With the FS‑1, you do not need to understand the details of how the ellipsometric measurement is made, and operating the sensor is simple. Innovation The Film Sense FS‑1™ Multi-Wavelength Ellipsometer uses long-life LED’s and a no-moving-parts ellipsometric detector to provide fast and reliable thin film measurements in an easy-to-use, compact system. Powerful The film thickness of most transparent thin films from 0 – 1000 nm can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples. Affordable The FS‑1 offers the power of Multi-Wavelength Ellipsometry, but at the price point of single wavelength ellipsometer and spectroscopic reflectometer systems. The FS‑1 is ideal for measurements in the research lab, classroom, in situ process chambers, industrial quality control, and more. Contact us at www.film-sense.com/contact-us/ for a white paper describing the performance and capabilities of the FS‑1 ellipsometer.

Website

http://www.film-sense.com

External link for Film Sense

Industry

Appliances, Electrical, and Electronics Manufacturing

Company size

2-10 employees

Headquarters

Lincoln, NE

Type

Privately Held

Founded

2013

Specialties

Thin Film Measurement, Ellipsometer, Thin Films, Metrology, and Ellipsometry